Small-angle X-ray diffraction studies on interface sharpness of amorphous Se/CdSe superlattices
- 1 November 1995
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 191 (1-2) , 205-208
- https://doi.org/10.1016/0022-3093(95)00303-7
Abstract
No abstract availableFunding Information
- Ministry of Education and Science (F-122)
This publication has 5 references indexed in Scilit:
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- Growth and structure of layered amorphous semiconductorsJournal of Non-Crystalline Solids, 1984