Error effects in the ellipsometric investigation of thin films
- 1 January 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 75 (4) , 355-369
- https://doi.org/10.1016/0040-6090(81)90258-3
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Evaluation of adjustment data for simple ellipsometersThin Solid Films, 1979
- Minority carrier MIS tunnel diodes and their application to electron- and photo-voltaic energy conversion—II. ExperimentSolid-State Electronics, 1974
- Minority carrier MIS tunnel diodes and their application to electron- and photo-voltaic energy conversion—I. TheorySolid-State Electronics, 1974
- Porosity of MgF2 Films—Evaluation Based on Changes in Refractive Index Due to Adsorption of VaporsJournal of Vacuum Science and Technology, 1969