Characterization of an analytical electron microscope with a NiO test specimen
- 31 July 1994
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 55 (1) , 43-54
- https://doi.org/10.1016/0304-3991(94)90079-5
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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