Electron Microscopy of Fast Processes
- 1 January 1989
- book chapter
- Published by Elsevier
Abstract
No abstract availableThis publication has 68 references indexed in Scilit:
- 17 ps rise-time measurement by photoemission samplingElectronics Letters, 1987
- Kinetics of laser-induced liquid metal etching of a-Si filmsPhysica Status Solidi (a), 1985
- Time-resolved TEM of laser-annealingPhysica Status Solidi (a), 1984
- Multiple phase transitions in GeTe films. Dynamics and film structurePhysica Status Solidi (a), 1983
- Explosive Liquid-Phase Crystallization of Ion-Implanted SiliconPhysica Status Solidi (a), 1982
- New reversal process of Néel Walls due to nanosecond field pulsesPhysica Status Solidi (a), 1981
- Dynamics of Néel Wall Transitions into Cross-Tie WallsPhysica Status Solidi (a), 1979
- Crystallization of amorphous silicon filmsPhysica Status Solidi (a), 1978
- Domain wall mass in permalloy filmsIEEE Transactions on Magnetics, 1975
- Über die Kristallisation aufgedampfter AntimonschichtenThe European Physical Journal A, 1955