A comparison of two models for the characteristic X-ray fluorescence correction in thin foil analysis
- 1 January 1984
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 133 (1) , 61-67
- https://doi.org/10.1111/j.1365-2818.1984.tb00463.x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A review of on‐line processing of chemical analysis data using a conventional CTEM/STEMJournal of Microscopy, 1982
- Quantitative X-Ray Microanalysis: Instrumental Considerations and Applications to Materials SciencePublished by Springer Nature ,1979
- The quantitative analysis of thin specimensJournal of Microscopy, 1975