A summary review of displacement damage from high energy radiation in silicon semiconductors and semiconductor devices
- 1 June 1992
- journal article
- review article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 39 (3) , 468-473
- https://doi.org/10.1109/23.277547
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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