Coupling and nonlinear effects of cantilever deflection and torsion encountered when simultaneously measuring vertical and lateral forces using the scanning probe method
- 30 November 1997
- Vol. 211 (2) , 198-202
- https://doi.org/10.1016/s0043-1648(97)00121-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Theoretical analysis of the static deflection of plates for atomic force microscope applicationsJournal of Applied Physics, 1993
- Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscopeApplied Physics Letters, 1990
- Microfabrication of cantilever styli for the atomic force microscopeJournal of Vacuum Science & Technology A, 1990