MIS characterization and modeling of the electrical properties of the epitaxial Caf2/Si(111) interface
- 1 May 1987
- journal article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 16 (3) , 169-175
- https://doi.org/10.1007/bf02655482
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
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