Charged particle effects on optoelectronic devices and bit error rate measurements on 400 Mbps fiber based data links
Open Access
- 1 June 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 41 (3) , 528-533
- https://doi.org/10.1109/23.299794
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Radiation Testing Of InGaAsP Fiber Optic Transmitter And Receiver ModulesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Particle-induced bit errors in high performance fiber optic data links for satellite data managementIEEE Transactions on Nuclear Science, 1994
- SEDS MIL-STD-1773 fiber optic data bus: Proton irradiation test results and spaceflight SEU dataIEEE Transactions on Nuclear Science, 1993
- Proton irradiation SEU test results for the SEDS MIL-STD-1773 fiber optic data bus: integrated optoelectronicsPublished by SPIE-Intl Soc Optical Eng ,1993
- Component tradeoffs and technology breakpoints for a 50 Mbps to 3.2 Gbps fiber optic data bus for space applicationsPublished by SPIE-Intl Soc Optical Eng ,1993
- Physical interactions between charged particles and optoelectronic devices and the effects on fiber-based data linksPublished by SPIE-Intl Soc Optical Eng ,1993
- Radiation response of 1300-nm optoelectronic components in a natural space environmentPublished by SPIE-Intl Soc Optical Eng ,1993
- A proton beam facility for single event researchNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991