Resolution of an optical image of a scanning near-field optical/atomic force microscope as a function of sample-probe distance during synchronized irradiation
- 1 February 1996
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 273 (1-2) , 331-334
- https://doi.org/10.1016/0040-6090(95)06797-3
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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