Numerical simulation of the pseudo-MOSFET characterization technique

This publication has 5 references indexed in Scilit:

• The HgFET: a new characterization tool for SOI silicon film properties
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Electrical Characterization of Silicon-on-Insulator Materials and Devices
  Published by Springer Nature ,1995
• Point-contact pseudo-MOSFET for in-situ characterization of as-grown silicon-on-insulator wafers
  IEEE Electron Device Letters, 1992
• Semiconductor Material and Device Characterization
  Physics Today, 1991
• A physically based mobility model for numerical simulation of nonplanar devices
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988