A New Technique for High Speed X-Ray Double Crystal Rocking Curve analysis
- 1 January 1986
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Simulation of X-ray double-crystal rocking curves at multiple and inhomogeneous heteroepitaxial layersJournal of Applied Crystallography, 1985
- Alignment of double-crystal diffractometersJournal of Applied Crystallography, 1985
- The interpretation of X-ray rocking curves from III–V semiconductor device structuresJournal of Crystal Growth, 1984
- Assessment of epitaxial layers by automated scanning double axis diffractometryJournal of Crystal Growth, 1983
- Theory of the Double X-Ray SpectrometerPhysical Review B, 1928