X-ray photoelectron spectroscopic studies with a bias-potential method for studying silane-aluminium interfaces
- 1 January 1993
- journal article
- research article
- Published by Springer Nature in Journal of Materials Science Letters
- Vol. 12 (11) , 844-846
- https://doi.org/10.1007/bf00277993
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- XPS studies of interfaces between γ-glycidoxypropyltrimethoxysilane and aluminum surfacesApplied Surface Science, 1992
- Silane Coupling AgentsPublished by Springer Nature ,1991
- Differential charging in XPS studies of polymer/metal interfacesApplied Surface Science, 1990
- Inelastic Electron Tunneling Spectroscopy of Some Aminosilane Coupling AgentsThe Journal of Adhesion, 1989
- Environmental and adhesive durability of aluminium-polymer systems protected with organic corrosion inhibitorsJournal of Materials Science, 1986
- Angle-resolved x-ray photoelectron spectroscopyProgress in Surface Science, 1984
- Analysis of Thin Films on Metal SurfacesThe Journal of Adhesion, 1981
- Analysis of the organization of protein films on solid surfaces by ESCAJournal of Colloid and Interface Science, 1981
- Structure and properties of organosilane primers for adhesive bondingApplications of Surface Science, 1981
- Surface analysis of polysiloxane/metal oxide interfacesJournal of Materials Science, 1977