Impact Ionization Coefficients of 4H-SiC
- 15 June 2004
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 457-460, 673-676
- https://doi.org/10.4028/www.scientific.net/msf.457-460.673
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Anisotropy in breakdown field of 4H–SiCApplied Physics Letters, 2002
- Temperature dependence of hole impact ionization coefficients in 4H and 6H-SiCSolid-State Electronics, 1999
- Ionization rates and critical fields in 4H silicon carbideApplied Physics Letters, 1997
- Ionization Rates for Electrons and Holes in SiliconPhysical Review B, 1958