Ionization Rates for Electrons and Holes in Silicon
- 1 March 1958
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 109 (5) , 1537-1540
- https://doi.org/10.1103/physrev.109.1537
Abstract
The ionization rates for holes and electrons in silicon have been determined over the following ranges of field: for holes, (2.5-6.0)× volts ; for electrons, (2.0-5.0)× volts . The ionization rate for electrons is higher than that for holes. The results suggest that the field dependence of the ionization rate for holes and, probably, for electrons also, can be expressed by , where is the field. The constants and are different for electrons and holes.
Keywords
This publication has 8 references indexed in Scilit:
- Threshold Energy for Electron-Hole Pair-Production by Electrons in SiliconPhysical Review B, 1957
- Ionization Rates for Holes and Electrons in SiliconPhysical Review B, 1957
- Townsend Ionization Coefficient for Hydrogen and DeuteriumPhysical Review B, 1956
- Basic Processes of Gaseous ElectronicsPublished by University of California Press ,1955
- Theory of Electron Multiplication in Silicon and GermaniumPhysical Review B, 1954
- Avalanche Breakdown in SiliconPhysical Review B, 1954
- Electron Multiplication in Silicon and GermaniumPhysical Review B, 1953
- The Mathematical Theory of Electrical Discharges in GasesReviews of Modern Physics, 1952