Discrepancies from a Perfect Match in the Etch Patterns on the Opposite Cleavage Faces in Bi2Te3
- 1 April 1967
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (5) , 2240-2243
- https://doi.org/10.1063/1.1709861
Abstract
Experimental evidence has been obtained, establishing that the deviations from a perfect one‐to‐one correspondence between etch pits on the opposite cleavage faces in Bi2Te3 are often due to bending and branching of the dislocations at the cleavage. It is suggested that the observation of deviations from the identical etch patterns on the opposite cleavage faces of a crystal does not necessarily imply the unreliability of an etch for revealing dislocations in that crystal.This publication has 2 references indexed in Scilit:
- Dislocation Studies in Bi2Te3 by Etch-Pit TechniqueJournal of Applied Physics, 1967
- XXV. The direct observation of dislocation nets in rock salt single crystalsPhilosophical Magazine, 1956