Sputter growth and chemical analysis by X-ray photoelectron spectroscopy/electron spectroscopy of an InSe thin film
- 1 June 1980
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 69 (1) , L5-L8
- https://doi.org/10.1016/0040-6090(80)90211-4
Abstract
No abstract availableKeywords
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