Noise in RF-CMOS mixers: a simple physical model
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- 1 January 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 35 (1) , 15-25
- https://doi.org/10.1109/4.818916
Abstract
Flicker noise in the mixer of a zero- or low-intermediate frequency (IF) wireless receiver can compromise overall receiver sensitivity. A qualitative physical model has been developed to explain the mechanisms responsible for flicker noise in mixers. The model simply explains how frequency translations take place within a mixer. Although developed to explain flicker noise, the model predicts white noise as well. Simple equations are derived to estimate the flicker and white noise at the output of a switching active mixer. Measurements and simulations validate the accuracy of the predictions, and the dependence of mixer noise on local oscillator (LO) amplitude and other circuit parameters.Keywords
This publication has 9 references indexed in Scilit:
- Receiver characterization using periodic small-signal analysisPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Noise in current-commutating CMOS mixersIEEE Journal of Solid-State Circuits, 1999
- A single-chip 900-MHz spread-spectrum wireless transceiver in 1-μm CMOS. II. Receiver designIEEE Journal of Solid-State Circuits, 1998
- A micropower CMOS, direct-conversion, VLF receiver chip for magnetic-field wireless applicationsIEEE Journal of Solid-State Circuits, 1998
- A 1 GHz CMOS RF front-end IC for a direct-conversion wireless receiverIEEE Journal of Solid-State Circuits, 1996
- Direct-conversion radio transceivers for digital communicationsIEEE Journal of Solid-State Circuits, 1995
- Flicker noise in CMOS transistors from subthreshold to strong inversion at various temperaturesIEEE Transactions on Electron Devices, 1994
- A systematic approach to the analysis of noise in mixersIEEE Transactions on Circuits and Systems I: Regular Papers, 1993
- High-frequency noise measurements on FET's with small dimensionsIEEE Transactions on Electron Devices, 1986