A model for sequential machine testing and diagnosis
- 1 August 1992
- journal article
- sequential machine-testing
- Published by Springer Nature in Journal of Electronic Testing
- Vol. 3 (3) , 219-234
- https://doi.org/10.1007/bf00134732
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The probability of error detection in sequential circuits using random test vectorsJournal of Electronic Testing, 1991
- Fault diagnosis of RAMs from random testing experimentsIEEE Transactions on Computers, 1990
- Random pattern testing versus deterministic testing of RAMsIEEE Transactions on Computers, 1989
- Logic Testing and Design for TestabilityPublished by MIT Press ,1985
- Fault detecting experiments for sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1964
- Derivation of optimum test sequencies for sequential machinesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1964