The probability of error detection in sequential circuits using random test vectors
- 1 January 1991
- journal article
- Published by Springer Nature in Journal of Electronic Testing
- Vol. 1 (4) , 245-256
- https://doi.org/10.1007/bf00136314
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- The pseudoexhaustive test of sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Roving Emulation as a Fault Detection MechanismIEEE Transactions on Computers, 1986
- MODIFIED TRANSITION MATRIX AND FAULT TESTING IN SEQUENTIAL LOGIC CIRCUITS UNDER RANDOM STIMULI WITH A SPECIFIED MEASURE OF CONFIDENCECybernetics and Systems, 1986
- The VLSI Implementation of a Reed—Solomon Encoder Using Berlekamp's Bit-Serial Multiplier AlgorithmIEEE Transactions on Computers, 1984
- Random Pattern TestabilityIEEE Transactions on Computers, 1984
- Random testing of integrated circuitsIEEE Transactions on Instrumentation and Measurement, 1981
- The Error Latency of a Fault in a Sequential Digital CircuitIEEE Transactions on Computers, 1976
- About Random Fault Detection of Combinational NetworksIEEE Transactions on Computers, 1976
- Probabilistic Analysis of Random Test Generation Method for Irredundant Combinational Logic NetworksIEEE Transactions on Computers, 1975
- Analysis of Logic Circuits with Faults Using Input Signal ProbabilitiesIEEE Transactions on Computers, 1975