Statistical Analysis of Dielectric Strength of BaTiO3 Ceramic Films
- 1 May 1980
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 19 (5) , 867-871
- https://doi.org/10.1143/jjap.19.867
Abstract
The Weibull function was successfully applied to dielectric strength data of BaTiO3 ceramic films. The degree of scatter in the dielectric strength was evaluated by the Weibull parameter β. The β value was from 6 to 7 for the large-grained specimen. The β values for the small-grained specimen were from 3 to 4. The dielectric strength of the latter specimen was larger than that of the former. For the intermediate specimen, the observed results of the dielectric strength split in two portions on the Weibull chart. The β value of one portion was 6.0 and the other was 3.9. The breakdown of the specimen was assumed to occur by bimodal mechanisms.Keywords
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