A New High-Resolution Tof Mass Spectrometer
- 1 January 1987
- journal article
- research article
- Published by Taylor & Francis in Instrumentation Science & Technology
- Vol. 16 (1) , 133-150
- https://doi.org/10.1080/10739148708543632
Abstract
UV laser-induced surface ionization with prism internal reflection is demonstrated to be a useful ion source for the Time-of-Flight mass spectrometer (TOF-MS). Spraying aniline (93 amu) on the prism surface and using 2 ns UV laser pulses, mass resolutions of 3,900 and 11,000 have been achieved in a linear TOF-MS and in a reflectron TOF-MS, respectively. Theoretical calculations indicate that mass resolution of over one million is possible, if a picosecond laser and appropriate electronics are employed.Keywords
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