Constant emission rate and constant capture rate capacitance spectroscopies applied to the determination of the properties of the states localized at Ag/Si and Au/Si interfaces
- 3 October 1985
- journal article
- Published by Elsevier in Surface Science
- Vol. 162 (1) , 640-644
- https://doi.org/10.1016/0039-6028(85)90960-4
Abstract
No abstract availableKeywords
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