Limited In incorporation during pseudomorphic InAs/GaAs growth and quantum dot formation observed by in situ stress measurements
- 1 March 2002
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 188 (1-2) , 75-79
- https://doi.org/10.1016/s0169-4332(01)00706-1
Abstract
No abstract availableKeywords
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