Dislocation etching in V3Si
- 1 January 1980
- journal article
- research article
- Published by Wiley in Crystal Research and Technology
- Vol. 15 (5) , 595-600
- https://doi.org/10.1002/crat.19800150517
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Mise en evidence d'un nouveau type de défaut réticulaire dans V3Si par microscopic électronique à haute tension (1000 kV)Philosophical Magazine A, 1978
- Influence of chemical composition within the range of homogeneity on phase transition and transition temperature of V3Si single crystals. II. On the defect structure of V3Si single crystalsPhysica Status Solidi (a), 1977
- Influence of chemical composition within the range of homogeneity on phase transition and transition temperature of V3Si single crystals. I. Preparation and characterization of single crystalsPhysica Status Solidi (a), 1977
- Einfluß der Realstruktur auf einige Eigenschaften von SupraleiternCrystal Research and Technology, 1974