Statistical modeling of transmission line model test structures. I. The effect of inhomogeneities on the extracted contact parameters
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 37 (11) , 2350-2360
- https://doi.org/10.1109/16.62287
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Obtaining the specific contact resistance from transmission line model measurementsIEEE Electron Device Letters, 1982
- Contact Resistance in Diffused ResistorsJournal of the Electrochemical Society, 1970