Direct structural determination by inversion of experimental diffuse low-energy electron diffraction intensities

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Abstract
We demonstrate that two-dimensionally resolved diffuse low-energy electron diffraction intensities can be measured with sufficient accuracy and at multiple energies to allow direct inversion for a low coverage (5%) disordered K/Ni(100) surface. The data inversion reveals three-dimensional coordinates of atoms with atom images whose full width at half maximum is less that 1 Å in all spatial directions. By varying the angle of incidence, first layer and second layer near-neighbor Ni atoms are separately imaged. This is the first demonstration of multiple-energy internal-source electron holography using measured elastically backscattered electrons.