Automatic measurement of charge storage in MNOS memory structures
- 1 July 1970
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 3 (7) , 558-560
- https://doi.org/10.1088/0022-3735/3/7/322
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Charge Transport and Storage in Metal-Nitride-Oxide-Silicon (MNOS) StructuresJournal of Applied Physics, 1969
- MEMORY BEHAVIOR OF AN MNS CAPACITORApplied Physics Letters, 1968