Line-shape analyses ofAuger spectra of-Si(100): Evidence for autoionization emission
- 1 June 1983
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 27 (11) , 6649-6661
- https://doi.org/10.1103/physrevb.27.6649
Abstract
In the light of recent advances in understanding the Auger process, the local electronic structural origins of selected core-valence-valence () Auger line shapes are analyzed for a transition-metal silicide prototype, Si. We report for clean -Si(100) Auger spectra that include the region of the vanadium and and the transitions. We compare the measured line shapes to spectra we generated based on the muffin-tin local density of states (DOS) calculated self-consistently by Klein et al. Good agreement in both the and the peak positions between experiment and calculation verified that the final-state hole-hole repulsion for and are both ∼0 eV. Also, the spectrum resembles that of elemental Si in that the line shape is predominantly a self-fold of the DOS. However, an unexpected result is that the V spectral region above the threshold possesses a broad (∼30-eV-wide) intense feature that is not amenable to conventional interpretation in terms of the transition or double-ionization or plasmon-gain satellites. We attribute this observation to the presence of Fano autoionization emission associated with deexcitation of the resonant transition. Supporting evidence comes from a comparison of our x-ray- and electron-stimulated Auger spectra, and to the line shape of the loss spectrum. In addition, oxygen-dosing Auger and x-ray photoelectron spectroscopy experiments (0-20 L) (1 langmuir = 1 L = Torr sec) indicate dramatic line-shape changes associated with oxidation, similar to that observed previously for Si. The initial oxidation rate is ∼ faster than that for elemental Si. We hypothesize that the dissociation of is a...
Keywords
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