Ion-Induced Anger Electrons Emitted from MgO and GaP under Shadowing Conditions
- 1 December 1986
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 25 (12R)
- https://doi.org/10.1143/jjap.25.1751
Abstract
By using single-crystal targets of MgO and GaP, we have measured the energy-degradation spectra of K-shell Auger electrons induced from Mg and P by twenty-MeV He++ ions. The spectra measured under ion-beam shadowing conditions were interpreted through a modified model in which multiple angular deflection of Auger electrons is taken into account. From the analysis, the stopping power for 1.18-keV electrons in MgO was determined to be 2.10±0.21 eV/Å, and that for 1.86-keV electrons in GaP was determined to be 1.60±0.15 eV/Å.Keywords
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