Specimen contamination in analytical electron microscopy: Sources and solutions
- 1 January 1978
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 3, 375-380
- https://doi.org/10.1016/s0304-3991(78)80057-6
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Quantitative analysis with an energy-dispersive detector using a pulsed electron probe and active signal filteringX-Ray Spectrometry, 1974
- The contamination of surfaces during high-energy electron irradiationPhilosophical Magazine, 1970
- The sources of electron-induced contamination in kinetic vacuum systemsBritish Journal of Applied Physics, 1954
- The origin of specimen contamination in the electron microscopeBritish Journal of Applied Physics, 1953
- An Effect of Electron Bombardment upon Carbon BlackJournal of Applied Physics, 1947