Thick target elemental analysis of organic and inorganic materials by PIXE using thin film standards
- 1 April 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 3 (1-3) , 198-202
- https://doi.org/10.1016/0168-583x(84)90362-8
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Quantitative analysis of complex targets by proton-induced x raysJournal of Applied Physics, 1975