A simplified method for the preparation of the reference system used in X-ray micro-radiography
- 31 December 1953
- journal article
- research article
- Published by Elsevier in Experimental Cell Research
- Vol. 4 (2) , 494-495
- https://doi.org/10.1016/0014-4827(53)90179-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A double-slit interferometer for the determination of the thickness of the reference system used in X-ray microradiographyExperimental Cell Research, 1953
- Determination by interferometric methods of the thickness of the reference system used in microradiographyExperimental Cell Research, 1952