Reduced invasiveness of noncontact electrooptic probes in millimeter-wave optoelectronic characterization
- 1 July 1996
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 44 (7) , 1155-1157
- https://doi.org/10.1109/22.508652
Abstract
We report time-resolved measurements of the invasiveness of LiTaO3 external probes in millimeter-wave electrooptic sampling. Using external probe tips at varying distances from a coplanar stripline, we show that invasiveness can be reduced in a noncontact configuration at the expense of measurement sensitivity. In the contact configuration, the risetime can be significantly lengthened by dispersion and signal reflection caused by the probe tip.This publication has 7 references indexed in Scilit:
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