Hot-Carrier Induced Ion/ioff Improvement of Offset Pmos TFT
- 1 January 1991
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A 0.1/spl mu/A standby current, bouncing-noise-immune 1Mb SRAMPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1988