Electron Capture by a Lattice Vacancy in Si
- 1 January 1960
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 117 (1) , 84-89
- https://doi.org/10.1103/physrev.117.84
Abstract
The electron-capture cross section of the deep trap due to a lattice vacancy in Si is calculated by taking into account the distortion of the lattice vibrations by the lattice vacancy. It is assumed that the trap is a neutral center for electron capture. The results show that although the distortion effect enlarges the calculated cross section by three orders of magnitude at 300°K, it is not enough to explain the magnitudes of observed cross sections.Keywords
This publication has 10 references indexed in Scilit:
- Radiation Effects on Recombination in GermaniumJournal of Applied Physics, 1959
- Neutron-Bombardment Damage in SiliconPhysical Review B, 1958
- Electron-Bombardment Damage in SiliconPhysical Review B, 1958
- Remarks on the Vibrations of Diatomic LatticesReviews of Modern Physics, 1958
- Colour centres in irradiated diamonds. IProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1957
- Thermal capture of electrons in siliconAnnals of Physics, 1957
- Energy Levels in Electron-Bombarded SiliconPhysical Review B, 1957
- Effect of Defects on Lattice Vibrations: Interaction of Defects and an Analogy with Meson Pair TheoryPhysical Review B, 1956
- Effect of Defects on Lattice VibrationsPhysical Review B, 1955
- Localized Electronic States in Bombarded SemiconductorsZeitschrift für Physikalische Chemie, 1951