Diagnostic System for Large Scale Logic Cards and LSI'S
- 1 January 1981
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
We have developed the diagnostic system, consisting of highly automated test generator, fast fault simulator and automatic fault locator. Several techniques, employed in the system, are as follows: 9-value D-Algorithm for sequential circuits., 6-value concurrent fault simulator., Functional Modeling of RAM'S, ROM'S, counters, and etc., Iterative processing of generator and simulator. This system has contributed to testing cards, and LSI'S used in Hitachi computer M-200H and others.Keywords
This publication has 2 references indexed in Scilit:
- A Deductive Method for Simulating Faults in Logic CircuitsIEEE Transactions on Computers, 1972
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967