Energy and mass analysis of secondary ions sputtered from metallic targets by MeV heavy ions
- 1 December 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 218 (1-3) , 293-298
- https://doi.org/10.1016/0167-5087(83)90993-6
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Surface Spectroscopy Using High Energy Heavy IonsIEEE Transactions on Nuclear Science, 1983
- Particle-induced desorption mass spectrometry of large involatile biomolecules: surface chemistry in the high-energy short-time domainAccounts of Chemical Research, 1982
- A comparison of fission fragment induced ion emission from metallic and dielectric filmsNuclear Instruments and Methods in Physics Research, 1982
- An improved time-of-flight method to measure energy spectra of secondary ions desorbed by fission fragmentsNuclear Instruments and Methods in Physics Research, 1982
- Sputtering of uranium tetrafluoride in the electronic stopping regionRadiation Effects, 1980
- High Energy Sputtering from Cleaned Metal FoilsZeitschrift für Naturforschung A, 1978
- "Sputtering" of Ice by MeV Light IonsPhysical Review Letters, 1978
- Recoil implantation from a thick film sourceRadiation Effects, 1978
- Energy spectrum of sputtered uranium—a new techniqueRadiation Effects, 1978
- Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)Surface Science, 1973