Surface Spectroscopy Using High Energy Heavy Ions
- 1 April 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 30 (2) , 1252-1254
- https://doi.org/10.1109/tns.1983.4332502
Abstract
Surface atoms ionized by high energy heavy ions have been detected by time-of-flight and quadrupole mass spectroscopic techniques. The experimental arrangements are described and potential applications are suggested. Both techniques are demonstrated to produce significant improvements in the detection of atomic hydrogen, with the TOF method producing a nine order of magnitude increase in the sensitivity of atomic hydrogen compared to standard nuclear analysis methods.Keywords
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