The theoretical and experimental study of the ionization processes during the low energy ion sputtering

This publication has 13 references indexed in Scilit:

• Velocity Filtering for Secondary Ion Quadrupole Mass Spectrometer
  Review of Scientific Instruments, 1973
• Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
  Surface Science, 1973
• A quantum-mechanical model for the ionization and excitation of atoms during sputtering
  Surface Science, 1973
• Secondary ion yields near 1 for some chemical compounds
  Physics Letters A, 1972
• Analytic methods for the ion microprobe mass analyzer. Part II.
  International Journal of Mass Spectrometry and Ion Physics, 1970
• Excitation of Cu atoms by Ar ions and subsequent radiationless deexcitation of scattered particles near a Cu surface
  Physica, 1969
• Collisions of Ar+ ions with surface Cu atoms and charge exchange of scattered ions near the metal surface
  Physica, 1969
• Zum Mechanismus der Ionenbildung und Ionenemission bei der FestkörperzerstÄubung
  The European Physical Journal A, 1969
• Self-Consistent Model of Hydrogen Chemisorption
  Physical Review B, 1969
• Progress in analytic methods for the ion microprobe mass analyzer
  International Journal of Mass Spectrometry and Ion Physics, 1969