γ-Al2O3 formation from pulsed-laser irradiated sapphire

Abstract
High‐resolution transmission electron microscopy was used to examine the effect of laser irradiation of sapphire (single crystalline α‐Al2O3). It was observed that laser‐melted material resolidified as γ‐Al2O3 epitactically grown on the (0001) plane of α‐Al2O3 having an orientation relationship (0001)α//(111)γ and [011̄0]α//[11̄0]γ. The interface between unmelted α‐Al2O3 and resolidified γ‐Al2O3 is atomically flat with steps of one to a few close‐packed oxygen layers. The high thermal gradient in the α‐Al2O3 did not produce any interfacial dislocations. However, pronounced lattice distortions existed in the resolidified γ‐Al2O3. It is argued that the very rapid cooling rate present during solidification prevents the ordering of Al atoms that is required for the formation of the stable α‐Al2O3 phase.