Circuit structure relations to redundancy and delay: the KMS algorithm revisited
- 2 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Timing analysis and delay-fault test generation using path-recursive functionsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Is redundancy necessary to reduce delay?IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1991