Centering and Tolerancing the Components of Microwave Amplifiers
- 1 January 1987
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 2 (0149645X) , 633-636
- https://doi.org/10.1109/mwsym.1987.1132490
Abstract
A simple graphical statistical method of circuit design centering and tolerancing for a desired circuit manufacturing yield is presented. The method is iterative and based on a parametric study of circuit yield estimates using Monte Carlo circuit analysis. Circuit elements including device s-parameters and distributed parameters as well as lumped components are considered. An application of this method is given in an example.Keywords
This publication has 4 references indexed in Scilit:
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