Design centering by yield prediction
- 1 February 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 29 (2) , 88-96
- https://doi.org/10.1109/tcs.1982.1085115
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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