Intersubbband absorption in narrow Si/SiGe multiple quantum wells without interfacial smearing

Abstract
Si/Si1−xGex multiple quantum wells with abrupt heterointerfaces have been formed by segregant‐assisted growth (SAG) with Sb. Distinct well‐width dependence of intersubband absorption in the narrow quantum wells has been observed. The well‐width dependence of the absorption peak energy is in good agreement with a calculation based on the Kronig–Penney model where interfacial smearing is taken to be less than 0.4 nm, suggesting the integrity of Si/Si1−xGex interfaces grown by SAG.