Fluorescent X-Ray Relative-Intensity Measurements
- 1 April 1972
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 5 (4) , 1587-1591
- https://doi.org/10.1103/physreva.5.1587
Abstract
Measured values of the relative intensities of several fluorescent x rays are reported for 13 elements ranging from cerium through plutonium. A solid-state Si(Li) spectrometer and a Bragg-diffraction spectrometer were used to analyze the x-ray excited fluorescence from thin samples. Corrections were made to the measured relative intensities for sample absorption, air absorption, and spectrometer efficiency. The accuracy of the measurements varies from ±5 to ±15%. The results are compared with those from the Scofield calculations.
Keywords
This publication has 15 references indexed in Scilit:
- X-Ray Transition Probabilities in Elements withPhysical Review A, 1971
- Intensitätsmessungen an RöntgenspektrallinienThe European Physical Journal A, 1934
- The Relative Intensities of the , , , and Lines in Tantalum, Tungsten, Iridium, and PlatinumPhysical Review B, 1932
- An Experimental Study of the Relative Intensities of X-Ray Lines in the Tantalum-SpectrumPhysical Review B, 1930
- An Experimental Study of the Relative Intensities of X-Ray Lines in the L-Spectrum of UraniumPhysical Review B, 1928
- An Experimental Study of the Relative Intensities of X-Ray Lines in the L-Spectrum of ThoriumPhysical Review B, 1927
- Intensit tsmessungen von R ntgenstrahlen mit Hilfe der Geigerschen SpitzenkammerThe European Physical Journal A, 1926
- Experiments on the Relative Intensities of some X-ray Lines in the L Spectrum of Tungsten and the K Spectrum of CopperPhysical Review B, 1925
- Note on X-Ray SpectraProceedings of the National Academy of Sciences, 1922
- On the Relative Positions and Intensities of Lines in X-ray SpectraProceedings of the National Academy of Sciences, 1920