Submillimeter and millimeter reflection spectroscopy of vacuum compatible absorbing materials
- 1 July 1983
- journal article
- research article
- Published by Springer Nature in International Journal of Infrared and Millimeter Waves
- Vol. 4 (4) , 591-597
- https://doi.org/10.1007/bf01009397
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Millimeter and submillimeter wave measurements of complex optical and dielectric parameters of materialsInternational Journal of Infrared and Millimeter Waves, 1982
- Electron cyclotron radiation measurements on the PLT tokamakPhysics of Fluids, 1981
- A fast-scanning heterodyne receiver for measurement of the electron cyclotron emission from high-temperature plasmasReview of Scientific Instruments, 1979
- Determination of the Optical Constants of Solids by Reflectance-Ratio Measurements at Non-Normal IncidenceJournal of the Optical Society of America, 1972
- Comparison of Reflection Methods for Measuring Optical Constants without Polarimetric Analysis, and Proposal for New Methods based on the Brewster AngleProceedings of the Physical Society, 1961