Millimeter and submillimeter wave measurements of complex optical and dielectric parameters of materials
- 1 May 1982
- journal article
- research article
- Published by Springer Nature in International Journal of Infrared and Millimeter Waves
- Vol. 3 (3) , 319-329
- https://doi.org/10.1007/bf01006247
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Measurement of the Dielectric Constant and Loss Tangent of Thallium Mixed Halide Crystals KRS-5 and KRS-6 at 95 GHzIEEE Transactions on Microwave Theory and Techniques, 1982
- Millimeter and submillimeter wave measurements of complex optical and dielectric parameters of materialsInternational Journal of Infrared and Millimeter Waves, 1981
- Precise Dielectric Measurements of Low-Loss Materials at Millimeter and Submillimeter WavelengthsIEEE Transactions on Microwave Theory and Techniques, 1977