Electric-field penetration into metals: consequences for high-dielectric-constant capacitors
- 1 April 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 46 (4) , 776-780
- https://doi.org/10.1109/16.753713
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Intrinsic dead layer effect and the performance of ferroelectric thin film capacitorsJournal of Applied Physics, 1997
- (Ba,Sr)TiO3 Thin Films for Dram’sPublished by Springer Nature ,1997
- Determination of the inversion-layer thickness from capacitance measurements of metal-oxide-semiconductor field-effect transistors with ultrathin oxide layersPhysical Review B, 1988
- Depolarization fields in thin ferroelectric filmsJournal of Applied Physics, 1973
- Theory of Metal Surfaces: Induced Surface Charge and Image PotentialPhysical Review B, 1973
- Surface-State and Interface Effects in Schottky Barriers at n-Type Silicon SurfacesJournal of Applied Physics, 1965
- Electric Field Penetration into MetalsJournal of Applied Physics, 1964
- Optical Properties of Ag and CuPhysical Review B, 1962
- Anomalous Capacitance of Thin Dielectric StructuresPhysical Review Letters, 1961
- Theory of Electrical Contact Between SolidsPhysical Review B, 1942