Hydrogen-related defects in irradiated SiO/sub 2/
- 1 December 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 47 (6) , 2289-2296
- https://doi.org/10.1109/23.903767
Abstract
No abstract availableThis publication has 46 references indexed in Scilit:
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